Contents
What is FIT? – Meaning and Calculation Method of Failure Rate per Hour
Introduction
When it comes to evaluating the reliability and failure rate of electronic components and systems, FIT (Failure In Time) is a commonly used metric. FIT represents the number of failures that can be expected in a billion hours of operation. In this blog post, we will delve into the meaning of FIT and explore its calculation method.
Definition of FIT
FIT is a unit of measure used to express the failure rate of a device. It stands for “Failure In Time” and is typically expressed in failures per billion hours of device operation. FIT is used to estimate the reliability of electronic components, such as integrated circuits, transistors, and capacitors.
Calculation Method
To calculate the failure rate in FIT, we need to first determine the number of failures that occurred during a specific period of time. This could be obtained from reliability test data or field failure reports. Once we have this data, we can then calculate the FIT value using the following formula:
FIT = (Number of Failures / Device Hours) * 10^9
In this formula, “Number of Failures” refers to the total number of failures experienced by the device during the specified period, and “Device Hours” represents the total operational time of the device in hours.
Example
Let’s take a practical example to understand the calculation of FIT. Suppose we have a computer server that operates for 10,000 hours and experiences 5 failures during this period. Using the formula mentioned earlier, we can calculate the FIT value as follows:
FIT = (5 / 10,000) * 10^9
= 500,000
Therefore, the FIT value for this computer server is 500,000 failures per billion hours of operation.
Importance of FIT
FIT is crucial in assessing the reliability of electronic components and determining their expected failure rate. It helps engineers and manufacturers evaluate and compare different components to choose the most reliable ones for their applications. FIT values also assist in making informed decisions regarding component selection and system design, ensuring the overall reliability and performance of electronic systems.
Conclusion
In summary, FIT (Failure In Time) is a measure of failure rate expressed in failures per billion hours of device operation. By calculating FIT, we can estimate the reliability of electronic components and systems. It plays a vital role in making informed decisions and ensuring the reliability and performance of electronic devices.
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